128 x 64 Dot Graphical LCD
On-Screen Standard Curve Display
Stray light below 0.3 %T
Store 200 groups of data and 200 standard scurves at the same time
PC Connectivity through USB Port Software Expands the function to WavelengthScanning, Multiwavelength, Quantitive and Kinetic Modes (optional at extra cost.)
Large Sample Compartment, can accommodate5-100 mm path length cuvettes with optional holders.
Microprocessor Spectrophotometer is a solid state microcontroller based instrument designed for quick and accurate spectrophotometric analysis of any concentration. It operates at a wavelength range of 320 nm to 1100 nm. The instrument uses the latest microprocessor technology and advanced engineering techniques so as to give enhanced accuracy and reproducibility.
The instrument is equipped with 128 x 64 dots graphical lcd the makes the result easy to read. User can on-screen see the standard curve. The system has soft touch numeric keys with complete numeric key that provides a convenient interface for entering numeric values. The
Provision has also been made for attachment of any dot matrix printer using centronics interface and PC connectivity through USB port. The Basic PC software is supplied with the instrument.
System has a 4-Position rapid cuvette changer (Test Tube Holder) selector.
SPECIFICATIONS :-
Wavelength | 320 - 1100 nm |
Spectral | 4 nm |
Wavelength | 1 nm |
Wavelength | 0.3 nm |
Wavelength | Auto |
Photometric | 0.3 %T |
Photometric | 0.2 %T |
Photometric | 0 - 200 %T, - 0.3 to 3A, 0 - 9999 Conc. |
Stability | 0.002 A/h @ 500 nm |
Baseline | 0.002 A/h |
Stray Light | < 0.3 %T |
Display | 128 x 64 Dots Graphical LCD |
Detector | Silicon Photodiode |
Output | USB Port for PC Connectivity, Parallel Port for Dot Matirx Printer |
Light Source | Tungsten Halogen Lamp |
Power | 230V 10% AC, 50 Hz |
Dimensions | Instrument: 450 x 320 x 195 mm (Approx.) |
Weight | Instrument: 11 Kg (Approx.) |
Accessories | Glass Cuvettes - A set of 4, Mains Lead, Operation Manual |
Note : Specifications are subject to change due to continuous improvements.
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